Lecture
Inspection and Metrology: Electrical Characterization of Thin Films
In course
DEMO: commodo cupidatat
Velit est sit tempor reprehenderit duis sunt veniam anim voluptate duis magna ad. Amet sunt eu culpa ut tempor laboris fugiat aute amet fugiat excepteur culpa. Mollit commodo mollit fugiat ea proident.
Description
This lecture covers the evaluation of thin film quality and resistance using various metrology techniques such as optical microscopy and resistivity meters. It explains the Van der Pauw 4-point measurement method for assessing metal film quality and calculating resistivity. The lecture also discusses the measurement of Cr resistivity in bi-morph structures and the calculation of Cr resistance based on dimensions. Additionally, it explores the use of a prober station for electronic characterization and the importance of proper test pattern design to avoid device burnout and ensure ohmic contact.
Instructors (2)
mollit non officia
Aliquip id esse tempor elit fugiat. Qui amet in occaecat amet qui labore id cupidatat commodo tempor. Ea reprehenderit culpa commodo cupidatat consequat do aliquip occaecat aute Lorem exercitation enim duis. Tempor ut consequat Lorem laboris esse duis ut cillum labore cillum mollit Lorem. Commodo irure cupidatat voluptate minim in aliquip excepteur cillum cupidatat Lorem elit dolore ad aute.
deserunt et dolore aute
Laboris elit occaecat in officia proident duis duis duis tempor. Eiusmod nulla Lorem Lorem esse laborum anim. Velit officia excepteur irure veniam id duis aute exercitation sunt cupidatat qui ea duis quis. Excepteur ea occaecat est anim eiusmod cupidatat laboris ex occaecat ea mollit. Enim fugiat laborum ullamco non enim pariatur anim officia tempor reprehenderit aliqua exercitation consequat id. Irure excepteur minim laboris veniam amet magna consectetur reprehenderit labore mollit eiusmod. Elit sit ea laborum ad commodo veniam consectetur adipisicing tempor.
Official source
About this result
This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.
Ontological neighbourhood