Plasma Heating: Electron vs Ion

In course

Description

This lecture discusses the impact of heating on electron and ion temperatures in plasmas, highlighting the differences between them and their applications in industrial settings. The instructor concludes the session by announcing a change in the Zoom channel for the next session.

Instructor

Official source

https://mediaspace.epfl.ch/media/0_c963nb6p

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Related concepts (14)

Plasma parameters

Plasma parameters define various characteristics of a plasma, an electrically conductive collection of charged particles that responds collectively to electromagnetic forces. Plasma typically takes the form of neutral gas-like clouds or charged ion beams, but may also include dust and grains. The behaviour of such particle systems can be studied statistically. All quantities are in Gaussian (cgs) units except energy and temperature which are in electronvolts.

Plasma stability

The stability of a plasma is an important consideration in the study of plasma physics. When a system containing a plasma is at equilibrium, it is possible for certain parts of the plasma to be disturbed by small perturbative forces acting on it. The stability of the system determines if the perturbations will grow, oscillate, or be damped out. In many cases, a plasma can be treated as a fluid and its stability analyzed with magnetohydrodynamics (MHD).

Plasma (physics)

Plasma () is one of four fundamental states of matter, characterized by the presence of a significant portion of charged particles in any combination of ions or electrons. It is the most abundant form of ordinary matter in the universe, being mostly associated with stars, including the Sun. Extending to the rarefied intracluster medium and possibly to intergalactic regions, plasma can be artificially generated by heating a neutral gas or subjecting it to a strong electromagnetic field.

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

Electron microscope

An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.