Electron Microscopy: In Situ

In course

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Description

This lecture covers the principles and applications of electron microscopy in situ, focusing on techniques such as time-resolved x-ray tomography, observation of sample evolution, and environmental TEM for SOFC. It also discusses the analysis of fracture surfaces, stress measurements, and deformation models.

Instructors (2)

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Official source

https://mediaspace.epfl.ch/media/0_4c0npvln

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Ontological neighbourhood

Chemical engineering

Nanotechnology: Topics in nanotechnology

Industrial and production engineering

Manufacturing engineering: Electron-beam technology

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