Lecture

Electron Microscopy: In Situ

Description

This lecture covers the principles and applications of electron microscopy in situ, focusing on techniques such as time-resolved x-ray tomography, observation of sample evolution, and environmental TEM for SOFC. It also discusses the analysis of fracture surfaces, stress measurements, and deformation models.

About this result
This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.