Electron Microscopy: EBSD

This lecture covers the basics of Electron Backscatter Diffraction (EBSD) in the Scanning Electron Microscope (SEM), including orientation measurements, phase identification, and near-surface techniques. It explains how EBSD works, the importance of sample preparation, and the acquisition and indexation of Electron Backscattered Patterns (EBSPs). The instructor discusses the uses of EBSD for quantitative microstructural data analysis, such as mapping, pole figures, strain analysis, and phase identification. Various materials like metals, ceramics, minerals, conductors, and insulators are analyzed using EBSD, while insulating materials require special preparation. The lecture also delves into the formation of EBSPs, diffraction of backscattered electrons, and the indexation of bands corresponding to crystallographic planes and zone axes.