Explores fracture mechanics, crack growth, and the weakest link theory, emphasizing the statistical distribution of crack sizes and the significance of the largest crack in material failure.
Covers the principles of Scanning Electron Microscopy, including SEM signals, detectors, and energy spectrum of electrons, as well as the efficiency of X-ray generation.
Explores bug-finding, verification, and the use of learning-aided approaches in program reasoning, showcasing examples like the Heartbleed bug and differential Bayesian reasoning.
