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Covers X-Ray Photoelectron Spectrometry (XPS), a surface analysis technique developed by Kai Siegbahn, explaining its components, mechanism, and analysis methods.
Explores modeling multilayer 2D materials, tight-binding models, and electrical conductivity in materials, emphasizing the importance of symmetries and reduced models.
Covers the transition from free to nearly free electron models, exploring energy levels, Fermi surfaces, effective mass, and electron behavior in metals.
Explores beam-matter interactions, focusing on emission phenomena from core electron ionization by X-Rays and electrons, and the competition between Auger and X-Rays emissions.
Discusses charge transport in semiconductors, covering mobility, scattering phenomena, and the engineering of one-dimensional channels in two-dimensional electron gases.
