Lecture
This lecture covers the basics of scanning electron microscopy (SEM), including the setup, electron sources, lenses, vacuum system, and detection system. It explains the electron-matter interactions, resolution, and why fast electrons are essential. The lecture also delves into SEM techniques, such as chemical analysis and Monte Carlo simulations, and discusses the consequences of using electrons, the vacuum system components, and the various types of lenses used in SEM. It further explores electron optics, aberrations, and detectors, emphasizing the importance of understanding trade-offs in SEM imaging.