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Lecture
Testing of VLSI Systems
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Related lectures (26)
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Logic Systems: Karnaugh Maps and TTL Gates
Explores Karnaugh maps, TTL gates, analog aspects of digital logic, and prime implicants.
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Digital Logic Circuits: CMOS and Verilog Design
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Logical Effort: Fundamentals of VLSI Design
Covers the Logical Effort method for optimizing logic delay and gate sizing impact.
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Covers Dijkstra's algorithm and its application to the all-pairs shortest path problem.
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Explores Karnaugh maps, grouping rules, and transistor logic in logic systems.
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Covers worst-case complexity, algorithms, and proofs including mathematical induction and recursion.