Lecture
This lecture covers the analysis and implementation of test techniques for digital VLSI systems, including test theory, fault modeling, automatic test-pattern generation, and measures of testability. It also explores design for testability, scan design, built-in-self-testing, and the Boundary-Scan standard. Students will gain a theoretical understanding of popular IC testing algorithms and introductory knowledge of test EDA software tools. The lecture delves into the necessity of VLSI testing, standard testing methods, and the integration of testing techniques into various phases of VLSI development. Additionally, it discusses the logistics of the course, course grading policy, and the relationship between integrated circuit test and VLSI design courses.