Lecture

VLSI Testing: Techniques and Economics

Description

This lecture covers the analysis and implementation of test techniques for digital VLSI systems, including test theory, fault modeling, automatic test-pattern generation, and measures of testability. It also explores design for testability, scan design, built-in-self-testing, and the Boundary-Scan standard. Students will gain a theoretical understanding of popular IC testing algorithms and introductory knowledge of test EDA software tools. The lecture delves into the necessity of VLSI testing, standard testing methods, and the integration of testing techniques into various phases of VLSI development. Additionally, it discusses the logistics of the course, course grading policy, and the relationship between integrated circuit test and VLSI design courses.

About this result
This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.

Graph Chatbot

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.