Convergent Beam Electron Diffraction

This lecture covers the principles of convergent beam electron diffraction (CBED), focusing on the use of small convergent illumination to select a much smaller specimen region, providing detailed information on thickness, orientation, and 3D structure. The instructor explains the elementary incident beams, the 2-beam condition, and the alignment of specimens using CBED as a crystal 'road map'. The effects of thickness on CBED 2-beam condition are discussed, including the measurement of sample thickness using dynamical scattering fringe patterns. Resources for further study in transmission electron microscopy and electron diffraction simulations are also provided.