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Explores Transmission Electron Microscopy (TEM) principles, contrast mechanisms, dislocation identification, and sample cleaning methods for accurate imaging.
Explores chemical bonding in solids, band structure, and surface scattering techniques for lattice parameter measurements and crystal orientation analysis.
Explores surface scattering phenomena, electron wavelength, constructive interference, organo-metallic particles, and synchrotron radiation in nanosciences.
Explores the components and operation of a Transmission Electron Microscope (TEM), including vacuum systems, electron sources, lenses, aberrations, and detectors.
