Lecture
This lecture covers the basics of Electron Backscatter Diffraction (EBSD), including the acquisition of EBSD patterns, sample preparation requirements, and the influence of accelerating voltage. It also delves into the uses of EBSD for orientation measurements, phase identification, and strain analysis. The presentation explores the indexing of EBSD patterns, the Hough transform for pattern analysis, and the spatial and angular accuracy of EBSD data. Additionally, it discusses the applications of EBSD in micro-crystallography, phase discrimination, and chemical analysis. The lecture concludes with a focus on data analysis techniques, orientation representations, and practical examples of EBSD applications in material science.