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Lecture
Electron-Induced Spin Crossover
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Electrical Metrology
Explores electrical metrology, covering random variables, noise sources, and their impact on electronic devices.
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Explores different types of noise in devices and circuits, including interference noise, inherent noise, and random signals.
RIN, Shot Noise, Circuit Noise - Examples
Explores laser operation basics, shot noise, and photodetectors' noise characteristics, emphasizing the importance of signal-to-noise ratio in signal detection.
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Explores the impact of noise in microelectronics on various circuit stages and devices.
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Explores shot noise in quantum point contacts, charge fluctuations, experimental results, and temperature dependence of quasiparticles.
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Electrical Metrology: Noise and Signal Analysis
Explores electrical metrology, emphasizing noise and signal analysis, covering topics such as charges, currents, voltages, and various noise sources.
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Explores shot noise, Johnson noise, and detectors in laser fundamentals and applications.
