Lecture

Contact Resistance: Theory and Measurements

In course

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Description

This lecture covers the concept of contact resistance in semiconductor devices, starting with Moore's Law and CMOS scaling. It explains the impact of contact resistance on FET characteristics, the quantum limit of resistance, and includes examples like carbon nanotubes. The lecture also delves into contact resistance measurements using techniques like the 4-probe method and transmission line method.

Instructors (2)

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Official source

https://mediaspace.epfl.ch/media/0_m7x7qmf5

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