Semiconductor Devices II: Contact Resistance Modeling

Covers the analysis of measurements and defects engineering in semiconductor devices, including density of states and defect probing.

Covers defect probing, 2D material defects, CV measurements, defect modelling, and experimental data analysis.

Explores density of states in semiconductor devices, covering electron gas, energy bands, Fermi-Dirac distribution, and band structures.

Covers the simulation of 2D Field Effect Transistors and the advantages of using Green's Function.

Explores common defects in 2D materials, their impact on device performance, and strategies for defect healing and positive applications.