Lecture
This lecture covers the challenges of imaging beam-sensitive materials using low-dose 2D and 4D STEM techniques, focusing on hybrid perovskites. It discusses the principles of 4D STEM, dose control, and intelligent data processing for signal extraction. The presentation explores the effects of beam damage on materials, growth processes, and the use of pixelated detectors for efficient detection. Additionally, it delves into the application of ptychography for achieving atom resolution imaging and the reconstruction methods for complex nanostructures. The lecture concludes with a discussion on the optimal transfer functions, signal-to-noise spectrum, and the benefits of noise-normalized transfer functions in ptychography.