Explores noise sources in data acquisition, including thermal, shot, and amplifier noise, as well as the effects of ADC noise.
Explores thermal noise in MOS Transistors, input noise of bipolar transistors, and noise in amplifier stages, mirrors, differential pairs, and opamps.
Explores the factors influencing the annoyance level of noise, such as loudness, spectrum, and temporal features.
Explores physics-informed imaging systems, including lensless imaging, deep learning for imaging challenges, and the development of noise models for low-light videos.
Compares diffusive noise and escape noise models in computational neuroscience, discussing simulation, calculation, and model fitting.
