Explores nanomagnetic imaging techniques for studying skyrmion crystals, edge currents, 2D materials, and correlated states.
Covers quality assessment of probes-layers using Resonant Mirror, Surface Plasmon Resonance, and Scanning Electron Microscopy.
Explores electrical metrology, covering random variables, noise sources, and their impact on electronic devices.
Covers scientific image processing fundamentals, software practices, and ethical considerations in image processing.
Explores different types of noise in electrical systems and their impact on electronic devices.
