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Lecture
Are you an EPFL student looking for a semester project?
Work with us on data science and visualisation projects, and deploy your project as an app on top of Graph Search.
This lecture covers the principles and applications of Scanning Probe Microscopy (SPM), focusing on techniques such as Electric Field Microscopy (EFM), Kelvin Force Microscopy (KF-AFM), Conductive AFM (CAFM), Spreading-resistance Microscopy (SSRM), and Magnetic Force Microscopy (MFM). It also discusses topics like Capacitance Microscopy (SCM), Chemically sensitive AFM, and Scanning Near-field Optical Microscopy (SNOM). The lecture explores the use of SPM in measuring voltage, current, resistivity, and magnetic forces, as well as its applications in lithography, temperature sensing, and chemical interactions.