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Lecture
Scanning Electron Microscopy Basics
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Related lectures (32)
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Sample Preparation for TEM Observation
Explores the methods and challenges of sample preparation for TEM observation, emphasizing the importance of size, composition, and safety measures.
Microstructure Characterization by SEM
Explores Microstructure Characterization by Scanning Electron Microscopy, covering interactions, morphology study, EDX analysis, and phase distribution.
