Sample Preparation for TEM Observation

This lecture covers the importance of sample preparation for Transmission Electron Microscope (TEM) observation, focusing on the methods and techniques used to ensure accurate and high-quality results. Topics include the significance of sample size, thickness, and composition, as well as the different types of preparations such as thin strip deposition, electrolytic polishing, and mechanical-physical methods. The lecture also discusses the challenges and considerations in sample preparation, including the use of polar or nonpolar solvents, the selection of support grids, and the impact of coatings on the sample. Additionally, it explores the applications of nanoparticles in various fields and the safety measures required when working with nanomaterials.