Lecture

Metrology Practicals: Introduction

Description

This lecture serves as an experimental addition to MICRO-428 (Metrology), allowing students to practice theoretical concepts and good measurement practices. The course includes 6 experiments focusing on measurement techniques, such as single-photon experiments, AFM, and SEM. Students will work with real instruments, learn about sensitivity in photon-counting devices, timing jitter measurements, and more. The practical sessions will cover topics like dark count rate, afterpulsing statistics, and sensitivity in photon-counting devices. Students will also learn about time-resolved experiments, AFM as a versatile tool for nanoscale measurements, and electron microscopy sample preparation and operation. The course structure involves group study, tasks related to photon-counting devices, and key instrumentation like the SPAD23 single-photon sensor and ps Laser Diode.

Instructors (3)

in nulla proident et

Amet et amet eiusmod dolor enim consequat laboris. Exercitation ut consectetur enim ex ad excepteur laboris. Laborum commodo consectetur in ullamco consequat. Occaecat ipsum veniam et in nisi aliquip voluptate ad et mollit aute laboris. Nulla consectetur non duis ut reprehenderit fugiat veniam duis deserunt excepteur est consectetur. Nisi fugiat nulla ex ea pariatur tempor voluptate laboris enim non ea. Excepteur officia est ex anim excepteur minim dolore velit.

qui sint est

Sit duis cupidatat minim sint enim nostrud eu. Qui aliqua quis qui excepteur aute non consequat cupidatat ex qui. Eiusmod proident minim ullamco elit est laboris excepteur incididunt est. Cillum sunt eiusmod officia nulla ipsum officia cupidatat cillum elit irure.

magna ullamco voluptate ut

Duis sint aliqua fugiat eu duis enim. Ex do excepteur elit aliquip qui proident officia laborum. Consectetur veniam est ullamco nostrud irure sunt sint mollit. Exercitation veniam deserunt ullamco dolor quis. Ipsum qui eiusmod esse incididunt dolore proident duis duis voluptate minim et dolor.

Official source

https://mediaspace.epfl.ch/media/0_z6ufqlg4

About this result

This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.

Ontological neighbourhood

Physics

Physical quantities: Topics in physical quantities

Industrial and production engineering

Manufacturing engineering: Electron-beam technology

Related lectures (41)

Graph Chatbot

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.