This lecture covers the principles of Scanning Transmission Electron Microscopy (STEM) for analytical microscopy. Topics include TEM diffraction, sample modes, detectors, diffraction contrast, HAADF versus HRTEM, EDS analysis, and STEM-EDS combination for quantitative mapping.
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Covers the principles and applications of Transmission Electron Microscopy, including imaging, diffraction, contrast mechanisms, and in situ techniques.
