Lecture

STEM: Scanning Transmission Electron Microscopy

Description

This lecture covers the principles of Scanning Transmission Electron Microscopy (STEM) for analytical microscopy. Topics include TEM diffraction, sample modes, detectors, diffraction contrast, HAADF versus HRTEM, EDS analysis, and STEM-EDS combination for quantitative mapping.

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In course

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Description

Instructors (2)

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Ontological neighbourhood

Industrial and production engineering

Manufacturing engineering: Electron-beam technology

Chemical engineering

Nanotechnology: Topics in nanotechnology

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