Pierre Jacquot

De nationalité suisse et française, Pierre Jacquot est né en 1947 à Besançon, où il obtient de luniversité de Franche-Comté la maîtrise de physique (1970) et le doctorat en physique (1973). Il est engagé en 1974 au département de génie civil de lEPFL pour développer un laboratoire dédié à l'analyse de déformation de corps solide, fondé sur loptique cohérente, et en particulier l'interférométrie holographique et la métrologie speckle.

La recherche et les mandats le confrontent à des problèmes de détermination du comportement mécanique, de contrôle non destructif, de vérification expérimentale de modèles numériques, de mesure de forme, de caractérisation de propriétés de matériaux, où ces nouvelles techniques optiques prouvent leur efficacité.

En 1978 il est nommé chargé de cours aux départements de génie civil et de physique. Pendant 3 ans, il sera aussi chargé de cours au département de microtechnique. Coordinateur du programme Erasmus Applied optics, il dispense un enseignement de spécialisation à l'Ecole supérieure d'optique, Orsay, à la Scuola di tecnologie ottiche, Nuoro, dans les formations CMOI-SFO et ateliers CNRS Photomécanique, à linstitut CREST de luniversité de Franche-Comté, Belfort. Il est nommé professeur titulaire EPFL en 1996. Il organise à Lausanne la conférence internationale Interferometry in speckle light en 2000. Son groupe et ses activités sont transférés la même année au Laboratoire de métrologie du département délectricité, qui devient en 2003 le Laboratoire de nanophotonique et métrologie.

Ses thèmes de recherche sont les éléments optiques diffractifs, l'analyse numérique d'interférogrammes, l'interférométrie speckle digitale, les méthodes de projection de franges, qui constituent le cadre des sujets de thèse proposés dans son groupe. Les besoins de la pratique orientent ses recherches vers des systèmes capables d'opérer hors du laboratoire, dans les halles d'essais, voire in situ. Dans ce but, il a co-initié le projet Eureka VISILAS d'analyse de déformation de grandes structures dans leur environnement. En collaboration avec lIOA-EPFL, et sous limpulsion de ce dernier, le piégeage et lagrégation optiques à léchelle mésoscopique ont été récemment adjoints aux activités du groupe.

Pierre Jacquot est membre de plusieurs comités scientifiques de conférences et dassociations.

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Interferometry

Interferometry is a technique which uses the interference of superimposed waves to extract information. Interferometry typically uses electromagnetic waves and is an important investigative techni

Divertor Erosion Monitoring in ITER Using Two-Wavelength Speckle Interferometry

Eric Gauthier, Pierre Jacquot

ITER will operate long-time discharges (400 s) at high performances (Q = 10) and will have to satisfy strong safety and operational limits in term of tritium and dust inventory. This implies to control the erosion of the plasma facing components. Erosion monitoring diagnostic based on speckle interferometry and an optical design with its implementation in ITER are presented.

Ieee-Inst Electrical Electronics Engineers Inc2014

In speckle interferometry (SI), temporal signals are amplitude- and frequency-modulated signals and exhibit a fluctuating background. Prior to phase computation, this background intensity must be eliminated. Here our approach is to build a complex signal from the raw one and to fit a circle through the points cloud representing its sampled values in the complex plane. The circle fit is computed from a set of points whose length is locally adapted to the signal. This procedure—new to our knowledge in SI—yields the background and the modulation depth and leads to the determination of the instantaneous frequency. The method, applied to simulated and experimental signals, is compared to empirical mode decomposition (EMD). It shows great robustness in the computation of the sought quantities in SI, especially with signals close to the critical sampling or, on the contrary, highly oversampled, situations where the background elimination by EMD is the most prone to errors.

Optical Society of America2011

Snap-shot profilometry with the empirical mode decomposition and a 3-layer color sensor

Sébastien Equis, Pierre Jacquot, Raik Schnabel

Remote sensing finds more and more applications, from industrial control, to face recognition, not forgetting terrain surveying. This trend is well exemplified by fringe projection techniques, which enjoyed a considerable development in the recent years. In addition of high requirement in terms of measurement accuracy and spatial resolution, the end-users of full-field techniques show a growing interest for dynamic regimes. We report here what we believe to be the use for the first time of a CMOS 3-layer color sensor (Foveon X3) as the key element of a RGB fringe projection system, together with the processing specifically elaborated for this sensor. The 3-layer architecture allows the simultaneous recording of three phase-shifted fringe patterns and features the precious asset of an unambiguous relationship between the physical sensor pixel and the picture pixel and this for each color layer, on the contrary of common color sensor arrays (Bayer mosaic and tri-CCD). Due to the overlapping of the spectral responses of the layers, color transformation is mandatory to achieve the separation of the three phase-shifted RGB projected fringe patterns. In addition, we propose the use of the Empirical Mode Decomposition to equalize the non-uniform responses of the three layers. Although the conversion of the phase into a height is of primary importance in an actual measurement, it is not treated here, the literature being profuse on the central projection model.

Optical Society of America2011