François Aguet

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Sub-resolution maximum-likelihood based localization of fluorescent nanoparticles in three dimensions

Michaël Unser, Dimitri Nestor Alice Van De Ville, François Aguet

Several recent studies have shown that fluorescent particles can be localized with an accuracy that is well beyond traditional resolution limits. Using a theoretical model of the image formation process that accounts for possible sources of noise, Cramer-R ...

Ieee Service Center, 445 Hoes Lane, Po Box 1331, Piscataway, Nj 08855-1331 Usa2007

Joint Texture and Topography Estimation for Extended Depth of Field in Brightfield Microscopy

Michaël Unser, Dimitri Nestor Alice Van De Ville, François Aguet

Brightfield microscopy often suffers from limited depth of field, which prevents thick specimens from being imaged entirely in-focus. By optically sectioning the specimen, the in-focus regions can be acquired over multiple images. Extended depth of field m ...

IEEE2006

The Colored Revolution of Bioimaging

Michaël Unser, Cédric René Jean Vonesch, François Aguet

With the recent development of fluorescent probes and new high-resolution microscopes, biological imaging has entered a new era and is presently having a profound impact on the way research is being conducted in the life sciences. Biologists have come to d ...

IEEE2006

Sub-Resolution Axial Localization of Nanoparticles in Fluorescence Microscopy

Michaël Unser, Dimitri Nestor Alice Van De Ville, François Aguet

SPIE2005

Three-Dimensional Feature Detection Using Optimal Steerable Filters

Michaël Unser, François Aguet, Mathews Jacob

We present a framework for feature detection in 3-D using steerable filters. These filters can be designed to optimally respond to a particular type of feature by maximizing several Canny-like criteria. The detection process involves the analytical computa ...

IEEE2005

A Maximum-Likelihood Formalism for Sub-Resolution Axial Localization of Fluorescent Nanoparticles

Michaël Unser, Dimitri Nestor Alice Van De Ville, François Aguet

One of the ongoing challenges in single particle fluorescence microscopy resides in estimating the axial position of particles with sub-resolution precision. Due to the complexity of the diffraction patterns generated by such particles, the standard fittin ...

OSA2005

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