Skip to main content

Search

Show all results for

Home

Person

Frédéric Zanella

About
Privacy
Disclaimer

Copyright © 2025 EPFL, all rights reserved

Graph Chatbot

About this result

This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.

Related publications (5)

Please note that this is not a complete list of this person’s publications. It includes only semantically relevant works. For a full list, please refer to Infoscience.

High-efficiency fill factor recovery using refractive microlens arrays imprinted on 0.5–256 kpixel front-side illuminated SPAD imagers

Edoardo Charbon, Claudio Bruschini, Ivan Michel Antolovic, Vladimir Pesic, Tommaso Milanese, Scott Anthony Lindner, Frédéric Zanella

Silicon-based single-photon avalanche diodes (SPADs) implemented in front-side illuminated arrays and imagers have often suffered from fill factor limitations. The corresponding reduced sensitivity can be sometimes traded off with longer acquisition times ...

SPIE2023

Optical-stack optimization for improved SPAD photon detection efficiency

Edoardo Charbon, Claudio Bruschini, Ivan Michel Antolovic, Ekin Kizilkan, Rolando Ferrini, Scott Anthony Lindner, Arin Can Ülkü, Marc Schnieper, Frédéric Zanella

Single-photon avalanche diodes (SPADs) are direct photon-to-digital detectors that enable scalable arrays with Poisson-limited signal-to-noise ratio and picosecond timing resolution. However, SPAD detectors require a guard-ring structure to prevent lateral ...

2019

Submicrometer Organic Thin-Film Transistors: Technology Assessment Through Noise Margin Analysis of Inverters

Christian Enz, Jean-Michel Sallese, Rolando Ferrini, Franz Xaver Pengg, Nenad Marjanovic, Frédéric Zanella

In this paper, we propose a methodology to evaluate the potential of submicrometer organic thin-film transistors (OTFTs) with nanoimprinted gate and self-aligned source and drain contacts. In the first step, the dedicated static model we previously reporte ...

Institute of Electrical and Electronics Engineers2014