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Extended focus depth for Fourier domain optical coherence microscopy

Theo Lasser, Rainer Leitgeb, Martin Villiger, Adrian Bachmann, Lukas Steinmann
2006
Journal paper
Abstract

We report on a new detection scheme for Fourier domain optical coherence microscopy that exhibits high transverse resolution along an axially extended focal range. Nearly constant transverse resolution of ∼1.5 μm along a focal range of 200 μm is experimentally verified with a maximum sensitivity of 105 dB. A broad-bandwidth Ti:sapphire laser allowed for an axial resolution of 3 μm in air.

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