Electric currentAn electric current is a flow of charged particles, such as electrons or ions, moving through an electrical conductor or space. It is defined as the net rate of flow of electric charge through a surface. The moving particles are called charge carriers, which may be one of several types of particles, depending on the conductor. In electric circuits the charge carriers are often electrons moving through a wire. In semiconductors they can be electrons or holes.
WireA wire is a flexible strand of metal. Wire is commonly formed by drawing the metal through a hole in a die or draw plate. Wire gauges come in various standard sizes, as expressed in terms of a gauge number or cross-sectional area. Wires are used to bear mechanical loads, often in the form of wire rope. In electricity and telecommunications signals, a "wire" can refer to an electrical cable, which can contain a "solid core" of a single wire or separate strands in stranded or braided forms.
American wire gaugeAmerican Wire Gauge (AWG), also known as the Brown & Sharpe wire gauge, is a logarithmic stepped standardized wire gauge system used since 1857, predominantly in North America, for the diameters of round, solid, nonferrous, electrically conducting wire. Dimensions of the wires are given in ASTM standard B 258. The cross-sectional area of each gauge is an important factor for determining its current-carrying ampacity.
Scanning electron microscopeA scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.
Wire ropeWire rope is several strands of metal wire twisted into a helix forming a composite rope, in a pattern known as laid rope. Larger diameter wire rope consists of multiple strands of such laid rope in a pattern known as cable laid. In stricter senses, the term wire rope refers to a diameter larger than , with smaller gauges designated cable or cords. Initially wrought iron wires were used, but today steel is the main material used for wire ropes. Historically, wire rope evolved from wrought iron chains, which had a record of mechanical failure.
Electron microscopeAn electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.
Transmission electron microscopyTransmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.
Scanning tunneling microscopeA scanning tunneling microscope (STM) is a type of microscope used for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer, then at IBM Zürich, the Nobel Prize in Physics in 1986. STM senses the surface by using an extremely sharp conducting tip that can distinguish features smaller than 0.1 nm with a 0.01 nm (10 pm) depth resolution. This means that individual atoms can routinely be imaged and manipulated.
ConvectionConvection is single or multiphase fluid flow that occurs spontaneously due to the combined effects of material property heterogeneity and body forces on a fluid, most commonly density and gravity (see buoyancy). When the cause of the convection is unspecified, convection due to the effects of thermal expansion and buoyancy can be assumed. Convection may also take place in soft solids or mixtures where particles can flow. Convective flow may be transient (such as when a multiphase mixture of oil and water separates) or steady state (see Convection cell).
Scanning probe microscopyScanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level. The first successful scanning tunneling microscope experiment was done by Gerd Binnig and Heinrich Rohrer. The key to their success was using a feedback loop to regulate gap distance between the sample and the probe.
