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We employ grazing-incidence femtosecond x-ray diffraction to characterize the coherent, femtosecond laser-induced lattice motion of a bismuth crystal as a function of depth from the surface with a temporal resolution of 193 +/- 8 fs. The data show direct c ...
Focused electron- and ion-beam induced processing are well established techniques for local deposition and etching that rely on decomposition of precursor molecules by irradiation. These high-resolution nanostructuring techniques have various applications ...
A lamella of uranium dioxide (similar to 10 x similar to 10 x similar to 0.02-0.20 mu m) was produced by focused ion beam for transmission electron and electron energy loss spectroscopy (EELS) examinations. This sample allows quantitative analysis of the E ...
Local measurements of the oxidation state of vanadium in monoclinic BiVO4 particles by means of electron energy-loss spectroscopy in scanning transmission electron microscopy reveal a pronounced surface reduction: within a 5-nm-thick shell, the oxidation s ...
The saturation stage of a multipactor discharge is considered of interest, since it can guide towards a criterion to assess the multipactor onset. The electron cloud under multipactor regime within a parallel-plate waveguide is modeled by a thin continuous ...
The use of electron energy loss spectroscopy (EELS) in determining the electronic properties of Si and thickness dependent loss function of Si with 0.14 eV energy resolution were investigated. The dielectric response function was used to describe the inter ...
It is believed that low frequency microinstabilities such as ion temperature gradient (ITG) driven modes and trapped electron modes (TEMs) are largely responsible for the experimentally observed anomalous transport via the ion and electron channels in a to ...
We propose an original approach called a "stencil-masked ion implantation process" for performing a spatially localized synthesis of a limited number of Si nanocrystals within a thin SiO2 layer. In this process, the SiO2 layer is irradiated with 1 keV sili ...
The knowledge of the inelastic double differential scattering cross section (DDSCS) is of utmost importance for microanalysis in electron energy loss spectrometry (EELS) in the electron microscope and for the investigation of electron energy loss near edge ...
We have developed an original time resolved cathodoluminescence (TRCL) set-up with temporal performances similar to those of conventional time resolved optical techniques, keeping the capability to get structural information through the secondary electron ...