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Schedule (computer science)

In the fields of databases and transaction processing (transaction management), a schedule (or history) of a system is an abstract model to describe execution of transactions running in the system. Often it is a list of operations (actions) ordered by time, performed by a set of transactions that are executed together in the system. If the order in time between certain operations is not determined by the system, then a partial order is used.

Scanning probe microscopy

Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level. The first successful scanning tunneling microscope experiment was done by Gerd Binnig and Heinrich Rohrer. The key to their success was using a feedback loop to regulate gap distance between the sample and the probe.

Commitment ordering

Commitment ordering (CO) is a class of interoperable serializability techniques in concurrency control of databases, transaction processing, and related applications. It allows optimistic (non-blocking) implementations. With the proliferation of multi-core processors, CO has also been increasingly utilized in concurrent programming, transactional memory, and software transactional memory (STM) to achieve serializability optimistically. CO is also the name of the resulting transaction schedule (history) property, defined in 1988 with the name dynamic atomicity.

Atomic force microscopy

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Isolation (database systems)

In database systems, isolation determines how transaction integrity is visible to other users and systems. A lower isolation level increases the ability of many users to access the same data at the same time, but increases the number of concurrency effects (such as dirty reads or lost updates) users might encounter. Conversely, a higher isolation level reduces the types of concurrency effects that users may encounter, but requires more system resources and increases the chances that one transaction will block another.

Btrfs

Btrfs (pronounced as "better F S", "butter F S", "b-tree F S", or simply by spelling it out) is a computer storage format that combines a based on the copy-on-write (COW) principle with a logical volume manager (not to be confused with Linux's LVM), developed together. It was founded by Chris Mason in 2007 for use in Linux, and since November 2013, the file system's on-disk format has been declared stable in the Linux kernel. Btrfs is intended to address the lack of pooling, snapshots, checksums, and integral multi-device spanning in .

Scanning tunneling microscope

A scanning tunneling microscope (STM) is a type of microscope used for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer, then at IBM Zürich, the Nobel Prize in Physics in 1986. STM senses the surface by using an extremely sharp conducting tip that can distinguish features smaller than 0.1 nm with a 0.01 nm (10 pm) depth resolution. This means that individual atoms can routinely be imaged and manipulated.

Concurrency control

In information technology and computer science, especially in the fields of computer programming, operating systems, multiprocessors, and databases, concurrency control ensures that correct results for concurrent operations are generated, while getting those results as quickly as possible. Computer systems, both software and hardware, consist of modules, or components. Each component is designed to operate correctly, i.e., to obey or to meet certain consistency rules.

Scanning electron microscope

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.

Principal component analysis

Principal component analysis (PCA) is a popular technique for analyzing large datasets containing a high number of dimensions/features per observation, increasing the interpretability of data while preserving the maximum amount of information, and enabling the visualization of multidimensional data. Formally, PCA is a statistical technique for reducing the dimensionality of a dataset. This is accomplished by linearly transforming the data into a new coordinate system where (most of) the variation in the data can be described with fewer dimensions than the initial data.