A high-sensitivity and quasi-linear capacitive sensor for nanomechanical testing applications
Graph Chatbot
Chat with Graph Search
Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.
DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.
In-situ materials tests have the advantage to link visual and sensor based information during a dynamic experiment. In this thesis, a compact indenter-scratch test device has been built at EPFL-LSRO and installed inside a Scanning Electron Microscope (SEM) ...
The focused electron beam induced deposition process is a promising technique for nano and micro patterning. Electrons can be focused in sub-angström dimensions, which allows atomic-scale resolution imaging, analysis, and processing techniques. Before the ...
The electron beam induced current (EBIC) technique was used to characterize a 32 μm thick hydrogenated amorphous silicon n-i-p diode deposited on top of an ASIC, containing several channels of active feedback pre-amplifiers (AFP) with peaking time of 5 ns. ...
We have developed an original time resolved cathodoluminescence (TRCL) set-up with temporal performances similar to those of conventional time resolved optical techniques, keeping the capability to get structural information through the secondary electron ...
Crack patterns of 100-nm-thick silicon oxide coating on polypropylene film subjected to equibiaxial stress loading are studied experimentally. The loading is achieved by means of a bulging cell mounted under an optical microscope with stepwise pressurizati ...
We present an image-guided microscope system using augmented reality image overlays added onto one of the views of the operating microscope. With this system, segmented objects, outlines of risk regions or access pathways, previously extracted from preoper ...
The knowledge of the inelastic double differential scattering cross section (DDSCS) is of utmost importance for microanalysis in electron energy loss spectrometry (EELS) in the electron microscope and for the investigation of electron energy loss near edge ...
LTCC (low temperature co-fired ceramic) technology has recently gained a remarkable application potential in sensors field. This can be ascribed to many advantages it offers: the ease of LTCC tape handling providing a great freedom in design and fabricatio ...
The design features of the injection system are analyzed and exptl. measurements are performed to define its parameters and energy characteristics of low-energy electron beams obtained for the electron capture dissocn. in Fourier transform ion cyclotron re ...
We present an automation technique for the growth of electron beam deposited tips on whole wafers of atomic force microscope cantilevers. This technique uses pattern recognition on scanning electron microscope images of successive magnifications to precise ...
