We have demonstrated the suitability of digital holographic microscopy (DHM) with near infra-red illumination for micro-optical elements and silicon micro-systems characterization, opening a wide field of quality control applications.
Paul Arthur Adrien Pierre Dreyfus
Marilyne Andersen, Caroline Karmann, Yunjoung Cho
Boi Faltings, Ljubomir Rokvic, Panayiotis Danassis