Soft errorIn electronics and computing, a soft error is a type of error where a signal or datum is wrong. Errors may be caused by a defect, usually understood either to be a mistake in design or construction, or a broken component. A soft error is also a signal or datum which is wrong, but is not assumed to imply such a mistake or breakage. After observing a soft error, there is no implication that the system is any less reliable than before. One cause of soft errors is single event upsets from cosmic rays.
Frequency-shift keyingFrequency-shift keying (FSK) is a frequency modulation scheme in which digital information is encoded on a carrier signal by periodically shifting the frequency of the carrier between several discrete frequencies. The technology is used for communication systems such as telemetry, weather balloon radiosondes, caller ID, garage door openers, and low frequency radio transmission in the VLF and ELF bands. The simplest FSK is binary FSK (BFSK), in which the carrier is shifted between two discrete frequencies to transmit binary (0s and 1s) information.
Frequency modulationFrequency modulation (FM) is the encoding of information in a carrier wave by varying the instantaneous frequency of the wave. The technology is used in telecommunications, radio broadcasting, signal processing, and computing. In analog frequency modulation, such as radio broadcasting, of an audio signal representing voice or music, the instantaneous frequency deviation, i.e. the difference between the frequency of the carrier and its center frequency, has a functional relation to the modulating signal amplitude.
Triple modular redundancyIn computing, triple modular redundancy, sometimes called triple-mode redundancy, (TMR) is a fault-tolerant form of N-modular redundancy, in which three systems perform a process and that result is processed by a majority-voting system to produce a single output. If any one of the three systems fails, the other two systems can correct and mask the fault. The TMR concept can be applied to many forms of redundancy, such as software redundancy in the form of N-version programming, and is commonly found in fault-tolerant computer systems.
ZFSZFS (previously: Zettabyte File System) is a with volume management capabilities. It began as part of the Sun Microsystems Solaris operating system in 2001. Large parts of Solaris – including ZFS – were published under an open source license as OpenSolaris for around 5 years from 2005, before being placed under a closed source license when Oracle Corporation acquired Sun in 20092010. During 2005 to 2010, the open source version of ZFS was ported to Linux, Mac OS X (continued as MacZFS) and FreeBSD.
Switched-mode power supplyA switched-mode power supply (switching-mode power supply, switch-mode power supply, switched power supply, SMPS, or switcher) is an electronic power supply that incorporates a switching regulator to convert electrical power efficiently. Like other power supplies, an SMPS transfers power from a DC or AC source (often mains power, see AC adapter) to DC loads, such as a personal computer, while converting voltage and current characteristics.
Cyclic redundancy checkA cyclic redundancy check (CRC) is an error-detecting code commonly used in digital networks and storage devices to detect accidental changes to digital data. Blocks of data entering these systems get a short check value attached, based on the remainder of a polynomial division of their contents. On retrieval, the calculation is repeated and, in the event the check values do not match, corrective action can be taken against data corruption. CRCs can be used for error correction (see bitfilters).
Wafer (electronics)In electronics, a wafer (also called a slice or substrate) is a thin slice of semiconductor, such as a crystalline silicon (c-Si), used for the fabrication of integrated circuits and, in photovoltaics, to manufacture solar cells. The wafer serves as the substrate for microelectronic devices built in and upon the wafer. It undergoes many microfabrication processes, such as doping, ion implantation, etching, thin-film deposition of various materials, and photolithographic patterning.
