Test automationIn software testing, test automation is the use of software separate from the software being tested to control the execution of tests and the comparison of actual outcomes with predicted outcomes. Test automation can automate some repetitive but necessary tasks in a formalized testing process already in place, or perform additional testing that would be difficult to do manually. Test automation is critical for continuous delivery and continuous testing.
FaradThe farad (symbol: F) is the unit of electrical capacitance, the ability of a body to store an electrical charge, in the International System of Units (SI), equivalent to 1 coulomb per volt (C/V). It is named after the English physicist Michael Faraday (1791–1867). In SI base units 1 F = 1 kg−1⋅m−2⋅s4⋅A2. The capacitance of a capacitor is one farad when one coulomb of charge changes the potential between the plates by one volt. Equally, one farad can be described as the capacitance which stores a one-coulomb charge across a potential difference of one volt.
Boundary scanBoundary scan is a method for testing interconnects (wire lines) on printed circuit boards or sub-blocks inside an integrated circuit. Boundary scan is also widely used as a debugging method to watch integrated circuit pin states, measure voltage, or analyze sub-blocks inside an integrated circuit. The Joint Test Action Group (JTAG) developed a specification for boundary scan testing that was standardized in 1990 as the IEEE Std. 1149.1-1990.
JTAGJTAG (named after the Joint Test Action Group which codified it) is an industry standard for verifying designs and testing printed circuit boards after manufacture. JTAG implements standards for on-chip instrumentation in electronic design automation (EDA) as a complementary tool to digital simulation. It specifies the use of a dedicated debug port implementing a serial communications interface for low-overhead access without requiring direct external access to the system address and data buses.
In-system programmingIn-system programming (ISP), or also called in-circuit serial programming (ICSP), is the ability of some programmable logic devices, microcontrollers, chipsets and other embedded devices to be programmed while installed in a complete system, rather than requiring the chip to be programmed prior to installing it into the system. It also allows firmware updates to be delivered to the on-chip memory of microcontrollers and related processors without requiring specialist programming circuitry on the circuit board, and simplifies design work.
Built-in self-testA built-in self-test (BIST) or built-in test (BIT) is a mechanism that permits a machine to test itself. Engineers design BISTs to meet requirements such as: high reliability lower repair cycle times or constraints such as: limited technician accessibility cost of testing during manufacture The main purpose of BIST is to reduce the complexity, and thereby decrease the cost and reduce reliance upon external (pattern-programmed) test equipment.
