Publication

Control of the Screening Ability at a Ferroelectric-Semiconductor Interface

Related publications (33)

About
Privacy
Disclaimer

Graph Chatbot

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.

Control of the Screening Ability at a Ferroelectric-Semiconductor Interface

Graph Chatbot

Chat with Graph Search

Patterned and self-assembled ferroelectric nano-structures obtained by epitaxial growth and e-beam lithography

Downscaling of Pb(Zr,Ti)O-3 film thickness for low-voltage ferroelectric capacitors: Effect of charge relaxation at the interfaces

Interface structure between silicon and its oxide by first-principles molecular dynamics

Patterned and self-assembled ferroelectric nano-structures obtained by epitaxial growth and e-beam lithography

Interface structure between silicon and its oxide by first-principles molecular dynamics

Downscaling of Pb(Zr,Ti)O-3 film thickness for low-voltage ferroelectric capacitors: Effect of charge relaxation at the interfaces