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Polarization Reversal in BiFeO3 Capacitors: Complex Behavior Revealed by PFM

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Polarization Reversal in BiFeO3 Capacitors: Complex Behavior Revealed by PFM

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Ferroelectric gate on AlGaN/GaN heterostructures

Electric-field-, temperature-, and stress-induced phase transitions in relaxor ferroelectric single crystals

High density and program-erasable metal-insulator-silicon capacitor with a dielectric structure of SiO2∕HfO2–Al2O3 nanolaminate∕Al2O3

Polarization reversal due to charge injection in ferroelectric films

Temperature dependence of the dielectric tunability of pyrochlore bismuth zinc niobate thin films

Microscopic aspects of the region-by-region polarization reversal kinetics of polycrystalline ferroelectric Pb(Zr,Ti)O-3 films

INTERDIGITATED NANOELECTRODES FABRICATED USING FIB

Mechanical stress effect on imprint behavior of integrated ferroelectric capacitors

Evidence for forward domain growth being rate-limiting step in polarization switching in < 111 >-oriented-Pb(Zr0.45Ti0.55)O-3 thin-film capacitors

Unusual size effect on the polarization patterns in micron-size Pb(Zr,Ti)O-3 film capacitors