Scanning tunneling microscopeA scanning tunneling microscope (STM) is a type of microscope used for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer, then at IBM Zürich, the Nobel Prize in Physics in 1986. STM senses the surface by using an extremely sharp conducting tip that can distinguish features smaller than 0.1 nm with a 0.01 nm (10 pm) depth resolution. This means that individual atoms can routinely be imaged and manipulated.
Scanning probe microscopyScanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level. The first successful scanning tunneling microscope experiment was done by Gerd Binnig and Heinrich Rohrer. The key to their success was using a feedback loop to regulate gap distance between the sample and the probe.
High-temperature superconductivityHigh-temperature superconductors (abbreviated high-Tc or HTS) are defined as materials with critical temperature (the temperature below which the material behaves as a superconductor) above , the boiling point of liquid nitrogen. They are only "high-temperature" relative to previously known superconductors, which function at even colder temperatures, close to absolute zero. The "high temperatures" are still far below ambient (room temperature), and therefore require cooling.
AlnicoAlnico is a family of iron alloys which in addition to iron are composed primarily of aluminium (Al), nickel (Ni), and cobalt (Co), hence the acronym al-ni-co. They also include copper, and sometimes titanium. Alnico alloys are ferromagnetic, and are used to make permanent magnets. Before the development of rare-earth magnets in the 1970s, they were the strongest type of permanent magnet. Other trade names for alloys in this family are: Alni, Alcomax, Hycomax, Columax, and Ticonal.
Weak orderingIn mathematics, especially order theory, a weak ordering is a mathematical formalization of the intuitive notion of a ranking of a set, some of whose members may be tied with each other. Weak orders are a generalization of totally ordered sets (rankings without ties) and are in turn generalized by (strictly) partially ordered sets and preorders.
Chirality (physics)A chiral phenomenon is one that is not identical to its (see the article on mathematical chirality). The spin of a particle may be used to define a handedness, or helicity, for that particle, which, in the case of a massless particle, is the same as chirality. A symmetry transformation between the two is called parity transformation. Invariance under parity transformation by a Dirac fermion is called chiral symmetry. Helicity (particle physics) The helicity of a particle is positive (“right-handed”) if the direction of its spin is the same as the direction of its motion.
Atomic force microscopyAtomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Chiral modelIn nuclear physics, the chiral model, introduced by Feza Gürsey in 1960, is a phenomenological model describing effective interactions of mesons in the chiral limit (where the masses of the quarks go to zero), but without necessarily mentioning quarks at all. It is a nonlinear sigma model with the principal homogeneous space of a Lie group as its target manifold. When the model was originally introduced, this Lie group was the SU(N) , where N is the number of quark flavors.
Scanning electron microscopeA scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.
Lexicographic orderIn mathematics, the lexicographic or lexicographical order (also known as lexical order, or dictionary order) is a generalization of the alphabetical order of the dictionaries to sequences of ordered symbols or, more generally, of elements of a totally ordered set. There are several variants and generalizations of the lexicographical ordering. One variant applies to sequences of different lengths by comparing the lengths of the sequences before considering their elements.
