Cyclotron radiationCyclotron radiation is electromagnetic radiation emitted by non-relativistic accelerating charged particles deflected by a magnetic field. The Lorentz force on the particles acts perpendicular to both the magnetic field lines and the particles' motion through them, creating an acceleration of charged particles that causes them to emit radiation as a result of the acceleration they undergo as they spiral around the lines of the magnetic field.
X-ray scattering techniquesX-ray scattering techniques are a family of non-destructive analytical techniques which reveal information about the crystal structure, chemical composition, and physical properties of materials and thin films. These techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy.
Health threat from cosmic raysHealth threats from cosmic rays are the dangers posed by cosmic rays to astronauts on interplanetary missions or any missions that venture through the Van-Allen Belts or outside the Earth's magnetosphere. They are one of the greatest barriers standing in the way of plans for interplanetary travel by crewed spacecraft, but space radiation health risks also occur for missions in low Earth orbit such as the International Space Station (ISS).
Orbital decayOrbital decay is a gradual decrease of the distance between two orbiting bodies at their closest approach (the periapsis) over many orbital periods. These orbiting bodies can be a planet and its satellite, a star and any object orbiting it, or components of any binary system. If left unchecked, the decay eventually results in termination of the orbit when the smaller object strikes the surface of the primary; or for objects where the primary has an atmosphere, the smaller object burns, explodes, or otherwise breaks up in the larger object's atmosphere; or for objects where the primary is a star, ends with incineration by the star's radiation (such as for comets).
Single-event upsetA single-event upset (SEU), also known as a single-event error (SEE), is a change of state caused by one single ionizing particle (ions, electrons, photons...) striking a sensitive node in a live micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistors. The state change is a result of the free charge created by ionization in or close to an important node of a logic element (e.g. memory "bit"). The error in device output or operation caused as a result of the strike is called an SEU or a soft error.
