A diamond-based scanning probe spin sensor operating at low temperature in ultra-high vacuum
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Combining the subwavelength resolution of near-field interactions with the optical contrast mechanisms of classical optical microscopy makes scanning near-field optical microscopy an interesting technique for many applications. In spite of more than ten ye ...
Many fundamental processes that govern the function of biological cells occur on or immediately under the cell membrane. Fluorescence marking of specific sites has had a large impact in the recognition of these processes. In addition, observation in an app ...
In this thesis new imaging approaches for optical microscopy are proposed and studied. They are based on the use of dynamic structured illumination in combination with a demodulation detection concept employing CMOS image detectors. Two particular implemen ...
Within the last 2 years our consortium has developed, built and tested an atomic force microscope for planetary science applications, in particular for the study of Martian dust and soil. An array of eight cantilevers and tips provides redundancy in case o ...
This thesis deals with the development of microfabrication technologies based on photoplastic structuring by lithographic and molding techniques. These technologies, combined with an original releasing method, allow for the simple fabrication of pseudo thr ...
Conventional Hall devices are widely employed to measure magnetic fields produced by millimetre sized (or larger) current-caring conductors or permanent magnets with a standard active area of about (100 um)^2. Micro-Hall sensors have recently emerged as a ...
Innovative surface imaging techniques allowing parallel magnetic and topographical microscopy with nanometer scale spatial resolution are developed in this project. Nanometer scale magnetosensitive devices on Atomic Force Microscopy (AFM) tips will be stud ...
We present an atomic force microscope ~AFM for operation at low temperatures under ultrahigh vacuum conditions. It uses the laser beam deflection method to measure the bending of the cantilever. The four quadrant photodiode allows the detection of vertical ...
Lithography on (100) single-crystal silicon and amorphous silicon is performed by electric-field-enhanced local oxidation of silicon using an atomic force microscope (AFM). Amorphous silicon is used as a negative resist to pattern silicon oxide, silicon ni ...