Publication
Vectorial scanning force microscopy using a nanowire sensor
Related publications (39)
Effect of Cation on Dye Regeneration Kinetics of N719-Sensitized TiO2 Films in Acetonitrile-Based and Ionic-Liquid-Based Electrolytes Investigated by Scanning Electrochemical Microscopy
Nikolaos Vlachopoulos, Ulf Anders Hagfeldt, Kazuteru Nonomura, Gunther Wittstock
Scanning electrochem. microscopy (SECM) in the feedback mode was used to study the kinetics of dye regeneration on cis-di(thiocyanato)-bis(2,2'-bipyridyl-4,4''-dicarboxylate) Ru(II)-sensitized TiO2 photoelectrochem. electrodes in contact with room temp. io ...
2012Scanning Tunneling Microscopy and Luminescence of Individual Nanostructures
A detailed investigation and characterization of the local properties of individual nanoscopic structures is of great importance for the understanding of novel physical phenomena at the nanoscale as well as for the assessment of their possible use in futur ...
EPFL2011Quantum Point Contact Microscopy
We introduce quantum point contact microscopy (QPCM) as a novel method for surface characterization, where the conductance through a quantum point contact formed by a metal atom between the tip of a scanning tunneling microscope and the surface is mapped a ...
2011Implementation and characterization of a quartz tuning fork based probe consisted of discrete resonators for dynamic mode atomic force microscopy
Nico de Rooij, Terunobu Akiyama
The quartz tuning fork based probe {e.g., Akiyama et al. [Appl. Surf. Sci. 210, 18 (2003)]}, termed "A-Probe," is a self-sensing and self-actuating (exciting) probe for dynamic mode atomic force microscope (AFM) operation. It is an oscillatory force sensor ...
American Institute of Physics2010Scanning Near-Field Optical Microscopy Study of Biomolecules, Elaboration of New SNOM Probes and Detection Methods
The combination of the topographic resolution of Scanning Probe Microscopy with the subwavelength information of light/matter interaction leads to a new instrument called Scanning Near-field Optical Microscope (SNOM). This new instrument is an ideal tool t ...
EPFL2010Sharp High-Aspect-Ratio AFM Tips Fabricated by a Combination of Deep Reactive Ion Etching and Focused Ion Beam Techniques
Luis Guillermo Villanueva Torrijo
The shape and dimensions of an atomic force microscope tip are crucial factors to obtain high resolution images at the nanoscale. When measuring samples with narrow trenches, inclined sidewalls near 90 or nanoscaled structures, standard silicon atomic forc ...
2010High resolution in situ magneto-optic Kerr effect and scanning tunneling microscopy setup with all optical components in UHV
Harald Brune, Stefano Rusponi, Philipp Buluschek, Nicolas Weiss, Anne Lehnert, Matthias Treier
A surface magneto-optic Kerr effect (MOKE) setup fully integrated in an ultrahigh vacuum chamber is presented. The system has been designed to combine in situ MOKE and scanning tunneling microscopy. Magnetic fields up to 0.3 T can be applied at any angle i ...
2009Cryo-AFM development for high resolution DNA imaging and spectroscopy
Susana del Carmen Tobenas Borron
The thesis presents the development of a custom made atomic force microscope (AFM) conceived to image biological molecules at low temperatures in ultrahigh vacuum conditions, and its application to DNA single molecule studies. Starting from a first prototy ...
EPFL2008Micro and nano tools for magnetic field imaging
Scanning probe microscopy has become, nowadays, a branch of microscopy widely used to image surfaces of different specimens. Among the various applications, the magnetic imaging is one of the most exciting scanning probe microscopy techniques. It allows th ...
EPFL2007Atomic force microscopy studies of nanotribology and nanomechanics
This thesis comes within the scope of tribology studies at the nanometer scale. The experimental techniques used in this work are essentially related to atomic force microscopy, which gives a direct access to the topography and forces of the studied system ...
EPFL2007