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Characterization of GigaRad Total Ionizing Dose and Annealing Effects on 28-nm Bulk MOSFETs

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Characterization of GigaRad Total Ionizing Dose and Annealing Effects on 28-nm Bulk MOSFETs

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Deep-UV-Enhanced Approach for Low-Temperature Solution Processing of IZO Transistors with High-k AlOx/YAlOx Dielectric

Monitoring radiation damage in the LHCb Tracker

Subthreshold Mismatch in Nanometer CMOS at Cryogenic Temperatures

Influence of Halo Implantations on the Total Ionizing Dose Response of 28-nm pMOSFETs Irradiated to Ultrahigh Doses

Exploration of Negative Capacitance Devices and Technologies

Modeling of Total Ionizing Dose Degradation on 180-nm n-MOSFETs Using BSIM3

MPA-SSA, design and test of a 65 nm ASIC-based system for particle tracking at HL-LHC featuring on-chip particle discrimination

Modeling Interface Charge Traps in Junctionless FETs, Including Temperature Effects

Subthreshold Mismatch in Nanometer CMOS at Cryogenic Temperatures

Cryogenic MOSFET Threshold Voltage Model

Exploration of Negative Capacitance Devices and Technologies

Modeling of Total Ionizing Dose Degradation on 180-nm n-MOSFETs Using BSIM3

Deep-UV-Enhanced Approach for Low-Temperature Solution Processing of IZO Transistors with High-k AlOx/YAlOx Dielectric

MPA-SSA, design and test of a 65 nm ASIC-based system for particle tracking at HL-LHC featuring on-chip particle discrimination

Subthreshold Mismatch in Nanometer CMOS at Cryogenic Temperatures

Monitoring radiation damage in the LHCb Tracker

Cryogenic MOSFET Threshold Voltage Model

Subthreshold Mismatch in Nanometer CMOS at Cryogenic Temperatures

Influence of Halo Implantations on the Total Ionizing Dose Response of 28-nm pMOSFETs Irradiated to Ultrahigh Doses

Modeling Interface Charge Traps in Junctionless FETs, Including Temperature Effects