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A Timing-Monitoring Sequential for Forward and Backward Error-Detection in 28 nm FD-SOI

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A Timing-Monitoring Sequential for Forward and Backward Error-Detection in 28 nm FD-SOI

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Cryogenic MOSFET Modeling for Large-Scale Quantum Computing

Polarity-Controllable Devices and Circuits for Doping-Free 2D Electronics

Circuit Design, Architecture and CAD for RRAM-based FPGAs

A High-PDE, Backside-Illuminated SPAD in 65/40-nm 3D IC CMOS Pixel With Cascoded Passive Quenching and Active Recharge

Circuit Designs of High-Performance and Low-Power RRAM-Based Multiplexers Based on 4T(ransistor)1R(RAM) Programming Structure

Statistical Fault Injection for Impact-Evaluation of Timing Errors on Application Performance

Statistical Fault Injection for Impact-Evaluation of Timing Errors on Application Performance

Thermal Issues in Deep Sub-Micron FDSOI Circuits

Robustness Analysis of Controllable-Polarity Silicon Nanowire Devices and Circuits

Multiple-Independent-Gate Field-Effect Transistors for High Computational Density and Low Power Consumption

Cryogenic MOSFET Modeling for Large-Scale Quantum Computing

Circuit Design, Architecture and CAD for RRAM-based FPGAs

Polarity-Controllable Devices and Circuits for Doping-Free 2D Electronics

A High-PDE, Backside-Illuminated SPAD in 65/40-nm 3D IC CMOS Pixel With Cascoded Passive Quenching and Active Recharge

Multiple-Independent-Gate Field-Effect Transistors for High Computational Density and Low Power Consumption

Robustness Analysis of Controllable-Polarity Silicon Nanowire Devices and Circuits

Circuit Designs of High-Performance and Low-Power RRAM-Based Multiplexers Based on 4T(ransistor)1R(RAM) Programming Structure

Statistical Fault Injection for Impact-Evaluation of Timing Errors on Application Performance

Statistical Fault Injection for Impact-Evaluation of Timing Errors on Application Performance

Thermal Issues in Deep Sub-Micron FDSOI Circuits