Determination of the time scale of photoemission from the measurement of spin polarization
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We present high-resolution valence band and core level spectra of silver for photoelectron kinetic energies up to 8 keV. At these kinetic energies we estimate a surface contribution of less than 3%. Taking advantage of the favourable sp/d relative cross-se ...
Recent high-resolution photoemission results on high-T-c superconductors and other low-dimensional systems solve some critical issues but also open new fundamental questions. A recent breakthrough enabled us to clarify the interplay of conflicting periodic ...
Titanium-containing amorphous hydrogenated carbon films (a-C:H/Ti) have been deposited by a medium-frequency-driven physical vapor deposition plasma-enhanced chemical-vapor deposition process at 40 kHz. Core-level photoelectron spectroscopy and valence-ban ...
We describe a new pulsed laser deposition (PLD) system that is linked to an angle-resolved photoemission (ARPES) chamber at the Synchrotron Radiation Center (SRC) in Wisconsin, USA. We also discuss our first results on epitaxially grown YBa2Cu3O7-delta (YB ...
We describe a new pulsed laser deposition (PLD) system that is linked to an angle-resolved photoemission (ARPES) chamber at the Synchrotron Radiation Center (SRC) in Wisconsin, USA. We also discuss our first results on epitaxially grown YBa2Cu3O7-δ (YBCO) ...
We measured typical quasi-one-dimensional organic metals (Bechgaard salts), using high resolution angle-resolved photoemission spectroscopy. We observe neither quasiparticle features near the chemical potential nor traces of a Fermi surface. The spectra, i ...
High-resolution angle-resolved photoemission and core-level photoemission measurements were performed on single crystal samples of the quasi-one-dimensional material (TaSe4)(2)I and the cuprate superconductor Bi2Sr2CaCu2O8+x. Resistivity measurements were ...
A comparative study has been made of iodine-intercalated Bi2Sr2Ca1Cu2Ox single crystal and 1 atm O2 annealed Bi2Sr2Ca1Cu1Ox single crystal using an AC susceptibility measurement, X-ray photoemission (XPS) and angle-resolved ultraviolet photoemission spectr ...
The paper presents room temperature photoreflectance measurements carried out on the Au/ultrathin Si/n-crystalline GaAs structure with the silicon interlayer thickness gradually changing from about 4-27 Angstrom prepared in situ under ultra-high-vacuum con ...
The move of photoemission analysis from the macroscopic to the microscopic domain has been accelerated by the advent of new ultrabright synchrotron sources of soft-X-rays. This makes an overview of photoemission spectromicroscopy, photoemission at high lat ...