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Wafer-scale MoS2 with water-vapor assisted showerhead MOCVD

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Wafer-scale MoS2 with water-vapor assisted showerhead MOCVD

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Measuring electrical properties in semiconductor devices by pixelated STEM and off-axis electron holography (or convergent beams vs. plane waves).

Non-negative matrix factorization-aided phase unmixing and trace element quantification of STEM-EDXS data

Mapping orthorhombic domains with geometrical phase analysis in rare-earth nickelate heterostructures

Study of growth-induced point defects and their impact on InGaN-based optoelectronic devices

A continuous-wave and pulsed X-band electron spin resonance spectrometer operating in ultra-high vacuum for the study of low dimensional spin ensembles

Controlling crystal cleavage in focused ion beam shaped specimens for surface spectroscopy

Exciton migration in two-dimensional materials

Controlled Formation of Nanoribbons and Their Heterostructures via Assembly of Mass-Selected Inorganic Ions

Composition and Element Distribution Mapping of γ′ and γ" Phases of Inconel 718 by High-Resolution Scanning Transmission Electron Microscopy and X-ray Energy-Dispersive Spectrometry

Colloidal Atomic Layer Deposition on Nanocrystals Using Ligand-Modified Precursors