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The knowledge of the inelastic double differential scattering cross section (DDSCS) is of utmost importance for microanalysis in electron energy loss spectrometry (EELS) in the electron microscope and for the investigation of electron energy loss near edge ...
In situ electron microscope observations of defects show that the incident high-energy electrons influence the evolution of microstructure of an irradiated material, reducing the number of defects seen in the field of view of the microscope. We investigate ...
Focused electron beam induced depositions of nickel-containing materials obtained by using bis(methylcyclopentadienyl)nickel(II) Ni(C5H4CH3)(2) and tetrakis(trifluorophosphine)nickel(0) Ni(PF3)(4) as precursors, were compared in terms of chemical compositi ...
In-situ materials tests have the advantage to link visual and sensor based information during a dynamic experiment. In this thesis, a compact indenter-scratch test device has been built at EPFL-LSRO and installed inside a Scanning Electron Microscope (SEM) ...
The electron beam induced current (EBIC) technique was used to characterize a 32 μm thick hydrogenated amorphous silicon n-i-p diode deposited on top of an ASIC, containing several channels of active feedback pre-amplifiers (AFP) with peaking time of 5 ns. ...
Wurtzite GaN/AlN quantum dots (QDs) are studied by time-resolved photoluminescence. Careful measurements allow us to reach the regime of a single electron-hole pair per dot, evidenced by a monoexponential decay of the luminescence and a stop of the time-de ...
The focused electron beam induced deposition process is a promising technique for nano and micro patterning. Electrons can be focused in sub-angström dimensions, which allows atomic-scale resolution imaging, analysis, and processing techniques. Before the ...
The first part of this thesis describes the development of an optimised LSO/LuYAP phoswich detector head for the ClearPET demonstrator positron emission tomograph (PET) dedicated to small animals that is under construction in Lausanne within the Crystal Cl ...
The spatial evolution of compositions and sub-structures inside focused-electron-beam-deposited tips from dicobalt-octacarbonyl Co2(CO)8 precursor at 25 keV and varying beam current (20 pA - 3 A) is extensively studied for the first time by means of energy ...
The fabrication of nanostructures using III-V semiconductors results in materials with different physical properties than the bulk materials. Their optical and electronic properties are tailored and developed on a large scale for the fabrication of optical ...
