Cylinder stressIn mechanics, a cylinder stress is a stress distribution with rotational symmetry; that is, which remains unchanged if the stressed object is rotated about some fixed axis. Cylinder stress patterns include: circumferential stress, or hoop stress, a normal stress in the tangential (azimuth) direction. axial stress, a normal stress parallel to the axis of cylindrical symmetry. radial stress, a normal stress in directions coplanar with but perpendicular to the symmetry axis.
Flow measurementFlow measurement is the quantification of bulk fluid movement. Flow can be measured using devices called flowmeters in various ways. The common types of flowmeters with industrial applications are listed below: Obstruction type (differential pressure or variable area) Inferential (turbine type) Electromagnetic Positive-displacement flowmeters, which accumulate a fixed volume of fluid and then count the number of times the volume is filled to measure flow. Fluid dynamic (vortex shedding) Anemometer Ultrasonic flow meter Mass flow meter (Coriolis force).
Color filter arrayIn digital imaging, a color filter array (CFA), or color filter mosaic (CFM), is a mosaic of tiny color filters placed over the pixel sensors of an to capture color information. The term is also used in reference to e paper devices where it means a mosaic of tiny color filters placed over the grey scale display panel to reproduce color images. Color filters are needed because the typical photosensors detect light intensity with little or no wavelength specificity and therefore cannot separate color information.
Signal-to-noise ratioSignal-to-noise ratio (SNR or S/N) is a measure used in science and engineering that compares the level of a desired signal to the level of background noise. SNR is defined as the ratio of signal power to noise power, often expressed in decibels. A ratio higher than 1:1 (greater than 0 dB) indicates more signal than noise. SNR is an important parameter that affects the performance and quality of systems that process or transmit signals, such as communication systems, audio systems, radar systems, imaging systems, and data acquisition systems.
Stress–strain analysisStress–strain analysis (or stress analysis) is an engineering discipline that uses many methods to determine the stresses and strains in materials and structures subjected to forces. In continuum mechanics, stress is a physical quantity that expresses the internal forces that neighboring particles of a continuous material exert on each other, while strain is the measure of the deformation of the material. In simple terms we can define stress as the force of resistance per unit area, offered by a body against deformation.
GasGas is one of the four fundamental states of matter. The others are solid, liquid, and plasma. A pure gas may be made up of individual atoms (e.g. a noble gas like neon), elemental molecules made from one type of atom (e.g. oxygen), or compound molecules made from a variety of atoms (e.g. carbon dioxide). A gas mixture, such as air, contains a variety of pure gases. What distinguishes a gas from liquids and solids is the vast separation of the individual gas particles.
Stress concentrationIn solid mechanics, a stress concentration (also called a stress raiser or a stress riser or notch sensitivity) is a location in an object where the stress is significantly greater than the surrounding region. Stress concentrations occur when there are irregularities in the geometry or material of a structural component that cause an interruption to the flow of stress. This arises from such details as holes, grooves, notches and fillets. Stress concentrations may also occur from accidental damage such as nicks and scratches.
Atomic force microscopyAtomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Kelvin probe force microscopeKelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features. When there is little or no magnification, this approach can be described as using a scanning Kelvin probe (SKP). These techniques are predominantly used to measure corrosion and coatings. With KPFM, the work function of surfaces can be observed at atomic or molecular scales.
