Exponential decayA quantity is subject to exponential decay if it decreases at a rate proportional to its current value. Symbolically, this process can be expressed by the following differential equation, where N is the quantity and λ (lambda) is a positive rate called the exponential decay constant, disintegration constant, rate constant, or transformation constant: The solution to this equation (see derivation below) is: where N(t) is the quantity at time t, N0 = N(0) is the initial quantity, that is, the quantity at time t = 0.
Cosmic microwave backgroundThe cosmic microwave background (CMB, CMBR) is microwave radiation that fills all space in the observable universe. It is a remnant that provides an important source of data on the primordial universe. With a standard optical telescope, the background space between stars and galaxies is almost completely dark. However, a sufficiently sensitive radio telescope detects a faint background glow that is almost uniform and is not associated with any star, galaxy, or other object.
System of units of measurementA system of units of measurement, also known as a system of units or system of measurement, is a collection of units of measurement and rules relating them to each other. Systems of measurement have historically been important, regulated and defined for the purposes of science and commerce. Instances in use include the International System of Units or () (the modern form of the metric system), the British imperial system, and the United States customary system.
Length measurementLength measurement, distance measurement, or range measurement (ranging) refers to the many ways in which length, distance, or range can be measured. The most commonly used approaches are the rulers, followed by transit-time methods and the interferometer methods based upon the speed of light. For objects such as crystals and diffraction gratings, diffraction is used with X-rays and electron beams. Measurement techniques for three-dimensional structures very small in every dimension use specialized instruments such as ion microscopy coupled with intensive computer modeling.
Accuracy and precisionAccuracy and precision are two measures of observational error. Accuracy is how close a given set of measurements (observations or readings) are to their true value, while precision is how close the measurements are to each other. In other words, precision is a description of random errors, a measure of statistical variability. Accuracy has two definitions: More commonly, it is a description of only systematic errors, a measure of statistical bias of a given measure of central tendency; low accuracy causes a difference between a result and a true value; ISO calls this trueness.
