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Q-factor optimization of a tuning-fork/fiber sensor for shear-force detection

Related publications (36)

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Load cell with positive, negative and zero stiffness operating modes for milli- to nanonewton contact force monitoring in electrical probing

Michal Stanislaw Smreczak

Monolithic integrated circuits (ICs) have been miniaturized over the past five decades, and today their components range in size from hundreds of microns to several nanometers. Making point contact with electrical samples under a microscope is referred to ...

EPFL2022

An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization

Georg Fantner, Santiago Harald Andany, Charlène Cécile Geneviève Brillard

In this work, we report on the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM). The HIM is a powerful instrument, capable of imaging and machining of nanoscale structures with sub-nanometer resolution, while the AFM is a ...

BEILSTEIN-INSTITUT2020

Scanning Near-field Optical Microscopy (SNOM) technique enables to overcome Abbe diffraction limit of far-field optics as well as to obtain simultaneously optical and topographical images. While the optical resolution of the method is limited by the apertu ...

EPFL2019

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Nowadays, sharpened glass fiber - made probes attached to a quartz tuning fork (TF) and exploiting the shear force - based feedback are by far the most popular in the field of SNOM. These probes are expensive, very fragile and their fabrication is difficul ...

SPIE-INT SOC OPTICAL ENGINEERING2018

Structure and functionality of polyelectrolyte brushes, a surface force perspective

Harm-Anton Klok, Xingyu Xu, Mark Billing, Jing Yu

The unique functionalities of polyelectrolyte brushes depend on several types of specific interactions, including solvent structure effects, hydrophobic forces, electrostatic interactions, and specific ion interactions. Subtle variations in the solution en ...

2018

Method and apparatus of using a scanning probe microscope

Adrian Pascal Nievergelt, Jonathan David Adams

a scanning probe microscope for high-speed imaging and/or nanomechanical mapping. The microscope comprises a scanning probe comprising a cantilever with a tip at the distal end; and means for modulating a tip-sample distance separating the tip from an inte ...

2016

Miniature active damping stage for scanning probe applications in ultra high vacuum

Klaus Kern, Maximilian Assig, Carola Strasser

Scanning probe microscope (SPM) experiments demand a low vibration level to minimize the external influence on the measured signal. We present a miniature six-degree of freedom active damping stage based on a Gough-Stewart platform (hexapod) which is posit ...

2012

NOVELTY - The scanning method involves generating data signal using a sensor. The first component based on a motion in a first direction of an actuator configured to provide motion between a sample and a probe in the first direction, the first direction su ...

2011

Two magnetic atoms, one attached to the tip of a scanning tunnelling microscope and one adsorbed on a metal surface, each constituting a Kondo system, have been proposed as one of the simplest conceivable systems potentially exhibiting quantum critical beh ...

2011

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We report the first use of polymethylmethacrylate (PMMA) optical fiber-made probes for scanning near-field optical microscopy (SNOM). The sharp tips were prepared by chemical etching of the fibers in ethyl acetate, and the probes were prepared by proper gl ...

Elsevier2010