Publication

Method and apparatus of using a scanning probe microscope

Adrian Pascal Nievergelt, Jonathan David Adams
2016
Patent

Abstract

a scanning probe microscope for high-speed imaging and/or nanomechanical mapping. The microscope comprises a scanning probe comprising a cantilever with a tip at the distal end; and means for modulating a tip-sample distance separating the tip from an intended sample to be viewed with the microscope, the means for modulating being adapted to provide a direct cantilever actuation.

Official source

https://infoscience.epfl.ch/record/228181?ln=en

About this result

This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.

Graph Chatbot

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.

Method and apparatus of using a scanning probe microscope

Graph Chatbot

Chat with Graph Search

A diamond spin qubit scanning probe microscope

Extracting transport channel transmissions in scanning tunneling microscopy using superconducting excess current

Extracting transport channel transmissions in scanning tunneling microscopy using superconducting excess current

A diamond spin qubit scanning probe microscope