Realization and characterization of magnetic multilayer for MFM tips

High resolution magnetic force microscopy plays an important role in the development of magnetic data storage media. Particularly the envisioned increase of the storage density to 1TBit per sqinch within the next five years requires an ongoing development of magnetic force microscopy. At that time a lateral resolution of magnetic features of 10nm is routinely achieved with sophisticated high aspect ratio tips. However, the above described needs of the hard disc industry clearly require a further development of magnetic force microscope tips. Intending an improvement of MFM tips we have developed antiferromagnetic (afm) coupled layers by separating two ferromagnetic (fm) Co films by a Ru interlayer of 0.9nm. The principle idea is to coat the SPM tips by a thin and small stripe of this multilayer along the tip taper what would lead to a dipole-like magnetic charge distribution at the tip apex.